Scan Design Techniques-2 MCQ

Test your knowledge with important Scan Design Techniques-2 MCQ and their applications. These MCQs are beneficial for competitive exams too. Explore 30 + more Scan Design Techniques-2 MCQs at Bissoy

• In scan/set method __________ is used to implement a scan path.
  ক

  serial registers

  খ

  storage elements

  গ

  parallel registers

  ঘ

  separate register
• The partial scan approach scan
  ক

  all input node faults

  খ

  all output node faults

  গ

  faults not detected by designer functional vector

  ঘ

  all faults
• Which occupies a lesser area?
  ক

  lssd

  খ

  boundary scan test

  গ

  serial scan

  ঘ

  partial scan
• The disadvantage of boundary scan method is that the fault coverage is less.
  ক

  true

  খ

  false
• Boundary scan method takes lesser time on test pattern generation.
  ক

  true

  খ

  false
• The boundary scan path tests the
  ক

  input nodes

  খ

  output nodes

  গ

  buffer nodes

  ঘ

  interconnection points
• The boundary scan path is provided with
  ক

  serial input pads

  খ

  parallel input pads

  গ

  parallel output pads

  ঘ

  buffer pads
• Boundary scan test is used to test
  ক

  pins

  খ

  multipliers

  গ

  boards

  ঘ

  wires
• Which is not the function of LSSD method?
  ক

  eliminates hazards

  খ

  eliminates races

  গ

  simplifies fault generation

  ঘ

  stores the data
• The circuit operation is independent of
  ক

  rise time

  খ

  fall time

  গ

  propagation delays

  ঘ

  all of the mentioned
• Which is used to control the scan path movement?
  ক

  clock signals

  খ

  input signals

  গ

  output signals

  ঘ

  delay signals
• The serial shift register is driven using
  ক

  one over-lapping clock

  খ

  two over-lapping clock

  গ

  one non over-lapping clock

  ঘ

  two non over-lapping clock