Automatic Test Pattern Generation MCQ

Test your knowledge with important Automatic Test Pattern Generation MCQ and their applications. These MCQs are beneficial for competitive exams too. Explore 30 + more Automatic Test Pattern Generation MCQs at Bissoy

• Which method is more complex?
  ক

  stuck at fault

  খ

  CA

  গ

  combinational ATPG

  ঘ

  sequential ATPG
• The sum of all propagation delays along a single path is given as
  ক

  gate delay fault

  খ

  transition fault

  গ

  path delay fault

  ঘ

  propagation fault
• The _________ between two signal is called as bridging fault.
  ক

  open circuit

  খ

  break

  গ

  connection

  ঘ

  short circuit
• Transient faults does not depend on operating condition.
  ক

  true

  খ

  false
• Stuck-at fault is an example of ______ fault model.
  ক

  transient

  খ

  permanent

  গ

  intermittent

  ঘ

  simple
• The stuck-at model is a _____ fault model.
  ক

  recurring

  খ

  equivalent

  গ

  simple

  ঘ

  logical
• ‘n’ signal lines can potentially have _____ stuck-at faults.
  ক

  n2

  খ

  2n

  গ

  n

  ঘ

  n/2
• The process of removing equivalent faults is called as
  ক

  equivalent removing

  খ

  bulk damaging

  গ

  fault collapsing

  ঘ

  fault reduction
• Faults which produce same faulty behaviour are known as
  ক

  similar faults

  খ

  equivalent faults

  গ

  correlative faults

  ঘ

  ambiguous faults
• The automatic test pattern generator method has ________ phases.
  ক

  two

  খ

  three

  গ

  four

  ঘ

  five
• Automatic test pattern generator detects only the fault and not its cause.
  ক

  true

  খ

  false